Digital Radio Test Set7100

7100
MANUFACTURER: VIAVI Solutions (d.Aeroflex)
TECHNOLOGIES: LTE
High performance instrument for testing the RF, baseband and protocol layers of wireless devices supporting multiple Radio Access Technologies.

 

High performance instrument for testing the RF, baseband and protocol layers of wireless devices supporting multiple Radio Access Technologies.

  • LTE FDD and TDD signalling network emulation
  • Protocol Development, Call Box and Service modes of operation
  • Broad RF test coverage
    • Comprehensive suite of RF parametric measurements
    • Extensive preconfigured 36.521 RF Test Case coverage
    • Test Campaign Manager and Report Generator
  • 6 GHz frequency range, covering all LTE spectrum allocations and bandwidths
  • Protocol logging and analysis
  • Multi-cell and Inter-RAT handover support
  • Multi-RAT testing: LTE, eHRPD, 1xRTT, GERAN, HSPA and TD-SCDMA
  • Functional testing
  • End-to-end IP packet data test
  • Integrated Fading/AWGN option
  • MIMO 2x2 and 4x2, Open Loop, Closed Loop and Transmit Diversity
  • Automation support using remote APIs
  • Built-in controller PC with Windows® XP Embedded
  • State of the art 12" touch-screen GUI

The Aeroflex 7100 Digital Radio Test Set provides all the tools required during the design, development and test stages of UE chipsets and terminals meeting 3GPP Rel-8 and Rel-9 standards.

The 7100 Digital Radio Test Set is used by RF developers, protocol stack teams, integration test groups and pre-conformance labs that are developing sub-systems and integrated designs that meet the requirements of the LTE standards. The 7100 also supports the service market, allowing field-returned devices to be rapidly screened prior to return to vendor or return to the end user. These teams benefit from the ease of use, comprehensive test capability, speed and low cost of ownership offered by the 7100.

The 7100 simulates the E-UTRAN and EPC (Enhanced Packet Core) to provide a realistic test environment for LTE terminals. Test procedures control the characteristics of the simulated network to allow a wide range of repeatable test scenarios to be created. An optional integrated Fading Simulator and AWGN source is available, allowing real-world signal conditions to be created in the lab.

LTE Development Mode for detailed protocol logging and analysis
Aimed at protocol stack development and integration, the 7100 Development Mode provides advanced logging capabilities for L1, L2 and L3 protocol layer to debug and resolve issues during development. Message filtering and search functions are provided to facilitate navigation. Customized test scenarios using all LTE sub-layers can be easily created with the Scenario Wizard using the simple drag-and-drop graphical interface.

LTE Call Box Mode for functional and application tests
All the key measurements are provided for characterizing the performance of LTE mobile devices, both at the radio interface and throughout the protocol stack, including the PCDP and IMS layers. End-to-end performance can be accurately assessed, along with correct idle mode and connected mode behavior with the 7100's Network Simulation mode. Call Box mode features a suite of 3GPP (36.521) standards-based RF Transmitter and Receiver test cases and a test campaign manager facility which enables test sequences to be defined and run from the 7100 touch-screen GUI.

LTE Service Mode for rapid, Go/No-Go testing
Using the same Lector PC application as used for GERAN/UTRAN Service testing, LTE capability can be added to existing Service test configurations by specifying the 7100 Service Mode. Connection to the UE is made via the 4916 antenna coupler in a 4921 RF shielded box, with a database of calibration factors used to configure the path loss. Test sequences can be created using the Scriptor software package and then executed using the Lector software. Please see the 7100-06 LTE Device Service Tester & 7310 Lector & Scriptor Family web-page for further details.

LTE Physical Layer testing and RF parametric tests
The 7100's Vector Signal Analyzer/Vector Signal Generator (VSA/VSG mode) provides a comprehensive set of RF parametric tests for characterization of LTE transmitters and receivers. The 7100 VSA/VSG Mode can generate and analyze both uplink and downlink LTE signals.

Data throughput tests under real-world conditions
The 7100 combines LTE baseband-generated multipath fading and accurate AWGN to enable simulation of a wide variety of real-world signal conditions in the lab. The innovative software-defined radio techniques employed not only reduce the cost of adding fading to a test environment, but also allow testing to be completed earlier in the design cycle to reduce expensive redesigns later on and to reduce the cost and time spent on field trials. Fading and AWGN is supported is SISO and both 2x2 and 4x2 MIMO configurations in both Development Mode and Call Box Mode.

Handover and Multi-RAT testing
The 7100 Digital Radio Test Set enables emulation of inter-RAT system selection and system reselection procedures. Handover between LTE and any of the supported wireless standards can be achieved with a single 7100 Radio Test Set. Inter-RAT handover between the non-LTE standards, 2G and 3G, is also supported by extension of the system.

Automated test development environments
The 7100 provides open Application Programming Interfaces (APIs) which facilitate complete control for development of test scripts. The 7100 LTE Command Line Interface provides a fine degree of control in manipulating the L1/L2 layers and the full protocol stack. The Application Programming Interface provides generic functions to configure and control the RRC/NAS layer, generate test scenarios, capture parametric measurement results, and control logging

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